8

Characterization of additives at polymer surfaces by ToF-SIMS

Year:
2002
Language:
english
File:
PDF, 127 KB
english, 2002
10

A numerical method for the integration of oscillatory functions

Year:
1971
Language:
english
File:
PDF, 532 KB
english, 1971
24

Energy distributions of atomic and molecular ions sputtered by C60+ projectiles

Year:
2006
Language:
english
File:
PDF, 275 KB
english, 2006
40

Depth profiling of polymer samples using Ga+ and C60+ ion beams

Year:
2009
Language:
english
File:
PDF, 143 KB
english, 2009
44

Characterizability of best approximations by means of a Kolmogorov criterion

Year:
1978
Language:
english
File:
PDF, 616 KB
english, 1978
48

Stretching the limits of static SIMS with C60+

Year:
2006
Language:
english
File:
PDF, 195 KB
english, 2006